Sample
Name
Tholins AMES 90%N2:10%CH4 (2%) on Spectralon (98%)
Database
Experimentalists
Date
2013-10-25
Provider
Delphine Nna-Mvondo at NASA Ames Research Center
Physical characteristics
Thickness
0.5 $\pm$ 0.2 $mm$
Mass
0.012 $\pm$ 0.001 $g$
Substrate material
Spectralon-99 (sintered PTFE with 99% directional-hemispheric reflectance in the Vis-NIR)
Substrate comments
$2 \pm 0.5mm$ thick sintered granular and porous layer (40% porosity)
Comments
Tholins partially covering Spectralon
The matter of this sample underwent the whole Experiment #1 prior to measurement, but its spectrum did not changed significantly during Experiment #1
Temperature
298.0 $\pm$ 3.0 $K$
Comments
Sample kept at ambient temperature
Type
ambient air
Fluid temperature
298.0 $K$
Fluid pressure
1.0 $atm$
Number
1
Arrangement
The tholin layer covers only 2% of the Spectralon substrate, which is thus bare over 98% of its surface
Layers