Rutile, 155 µm section of a single crystal, surface along crystallographic c-axis | DOCCD

Sample

Name: Rutile, 155 µm section of a single crystal, surface along crystallographic c-axis

Database

Experimentalists

Origin of sample

Thickness: 155.0 ${\mu}m$
Diameter: 1500.0 ${\mu}m$
Comments: The rutile crystal is elongated along the crystallographic c-axis, the width of the crystal is about 1.5 mm.

Publications

Number

Layers

Title

Sample preparation of the rutile crystal

Sample

Rutile, 155 µm section of a single crystal, surface along crystallographic c-axis (this sample)

Processing steps

Step	Chronology	Date	Type	Process	Changes
#1	before layer formation		mechanical	Cutting of the sample along the crystallographic c-axis
#2	during layer formation		mechanical	Grinding and polishing of both sides of the sample to obtain a section with a thickness of 155 µm.