- Database
- Experimentalists
- Date
- 2014-11-08
- Provider
- CML laboratory
- Thickness
- 0.01 $\pm$ 0.005 $cm$
- Diameter
- 0.5 $cm$
- Substrate material
- Diamond
- Substrate comments
- Sample was in the custom made environmental chamber with controlled relative humidity of D2O vapor
- Comments
- Thin film deposited on top of ATR crystal
- Temperature
- 25.0 $\pm$ 3.0 $^{\circ}C$
- Time at T
- 20.0 $\pm$ 3.0 $min$
- Temperature max
- 25.0 $\pm$ 3.0 $^{\circ}C$
- Comments
- Sample kept under room temperature and pressure
- Type
- molecular gas
- Fluids
-
- N2 5.0 AirProducts 98.0 $\pm$ 0.5 %
- D2O 2.0 $\pm$ 0.5 %
- Fluid temperature
- 25.0 $\pm$ 3.0 $^{\circ}C$
- Fluid pressure
- 1013.0 $\pm$ 15.0 $hPa$
- Time at T, P, pH
- 20.0 $\pm$ 3.0 $min$
- Comments
- Fluid type: Nitrogen wet with D2O vapor
- Number
- 1
- Layers
-
- K-smectite saturated with D2O at RH=70% , 0.01 $cm$
- Title
- D2O saturation of smectite
- Samples
- Sample
- K-exchanged smectite saturated with D2O at RH=70% (this sample)
- Processing steps
-
Step Chronology Date Type Process Changes #1 during layer formation 2014-11-08 fluid physical Saturation of a thin film of the sample with D2O-wet nitrogen gas (70% relative humidity) for 15+/-5 min at room p,T. Change of the amount of the adsorbed D2O in the interlayer of the smectite