- Title
- Co K edge XAS fluorescence of CoFePt deposited on silicium (normal incidence: 5°)
- Database
- Experiment type
- laboratory measurement
- Spectrum type
- fluorescence emission
- Version
- #1 (2021-02-09 15:34:48 UTC+0000)
- Instrument
- X-ray Absorption Spectroscopy measured in fluorescence mode
- Spectral observation mode
- spectrum
- Valid spectral range(s)
- 7580.0 - 8452.0 $eV$
- Observation geometry
- directional :
- Angle observation mode
- fixed angles
- Spatial observation mode
- single spot
- Name
- CoFePt deposited on silicium
- Origin
- commercial
- Thickness
- 2.13e-08 $mm$
- Temperature
- 25.0 $\pm$ -268.1 $^{\circ}C$
- Pressure
- 1.0 $atm$
References
- Data reference
- Paleo, Charles; Le Roy, Damien; Dupuis, Véronique (2018): Co K edge, Fe K edge and Pt L3 edge XAS fluorescence of CoFePt nanocomposite films. SSHADE/FAME (OSUG Data Center). Dataset/Spectral Data. https://doi.org/10.26302/SSHADE/EXPERIMENT_CP_20180418_001
- Publications