Sample
Name
Tholins AMES 90%N2:10%CH4 (4%) on Spectralon (96%)
Database
Experimentalists
Date
2013-10-25
Provider
Delphine Nna-Mvondo at NASA Ames Research Center
Physical characteristics
Thickness
0.5 ± 0.2 mm
Mass
0.012 ± 0.001 g
Substrate material
Spectralon-99 (sintered PTFE with 99% directional-hemispheric reflectance in the Vis-NIR)
Substrate comments
2±0.5mm thick sintered granular and porous layer (40% porosity)
Comments
Tholins partially covering Spectralon
The matter of this sample underwent the whole Experiment #1 prior to measurement, but its spectrum did not changed significantly during Experiment #1
Temperature
298.0 ± 3.0 K
Comments
Sample kept at ambient temperature
Type
ambient air
Fluid temperature
298.0 K
Fluid pressure
1.0 atm
Number
1
Arrangement
The tholin layer covers only 4% of the Spectralon substrate, which is thus bare over 96% of its surface
Layers