- Database
- Experimentalists
- Date
- 1991-05-28
- Diameter
- 20000.0 ${\mu}m$
- Surface roughness
- very low
- Substrate material
- PE-HD
- Substrate comments
- disk diameter 25mm, thickness 2mm
- Comments
- sample deposited at 33.2K and then subjected to heating/cooling cycles during spectrum recording (warming to 100K, cooling to 33.5K, and heating up to crystallization
- Temperature
- 33.2 $\pm$ 1.0 $K$
- Time at T
- 10.0 $min$
- Temperature max
- 33.2 $\pm$ 1.0 $K$
- Time at Tmax
- 12.0 $min$
- Type
- vacuum
- Fluid pressure
- 1.0e-12 $\pm$ 1.0e-12 $bar$
- Comments
- residual UHV vacuum gases
- Number
- 1
- Layers
- Title
- condensation of amoprhous H2O ice
- Matters
- Sample
- thin film H2O amorphous Ia ice (this sample)
- Processing steps
-
Step Chronology Date Type Process Changes #1 before layer formation 1995-11-12 fluid physical several freeze-thawn cycles of liquid H2O under dynamic primary vacuum (pumping) removing of air and some CO2 gas #2 before layer formation 1995-11-12 fluid physical evaporation at ~20°C of liquid H2O from liquid to gas phase #3 during layer formation 1995-11-12 layer formation low flux of room temperature H2O gas deposited at 33.2K under vacuum from gas phase to solid amorphous Ia ice phase