- Database
- Experimentalists
- Date
- 2010-01-01
- Provider
- IPAG
- Thickness
- 10.0 $\pm$ 5.0 ${\mu}m$
- Diameter
- 50.0 ${\mu}m$
- Substrate material
- microscope glass slide
- Comments
- manual selection under binocular of about 10 IOM fragments of approximate diameter of 50 microns
- Temperature
- 22.0 $\pm$ 2.0 $^{\circ}C$
- Temperature max
- 22.0 $\pm$ 2.0 $^{\circ}C$
- Comments
- sample prepared and stored, and data acquired under standard temperature and pressure conditions. The temperature may change during Raman data acquisition (laser irradiation), but it has not been quantified
- Type
- ambient air
- Fluid pressure
- 1.0 $\pm$ 0.1 $atm$
- Comments
- MATair_lab_wet
- Number
- 1
- Layers
-
- IOM fragments of Murchison shocked at 20 GPa , 10.0 ${\mu}m$
- Title
- Preparation of the sample for Raman measurements
- Matters
- Sample
- IOM from Murchison shocked at 20 GPa (this sample)
- Processing steps
-
Step Chronology Date Type Process Changes #1 before layer formation mechanical Manual selection under optical binocular of about 10 IOM fragments of about 50 microns diameter. #2 during layer formation mechanical Fragments pressed between two glass slides with a mechanical press Fragments crushed down to a thickness of about 10 microns