Sample
Name
IOM from Murchison shocked at 5 GPa
Date
2010-01-01
Provider
IPAG
Thickness
10.0 $\pm$ 5.0 ${\mu}m$
Diameter
50.0 ${\mu}m$
Substrate material
Type IIa diamond windows
Comments
manual selection under binocular of about 10 IOM fragments of approximate diameter of 50 microns
Temperature
22.0 $\pm$ 2.0 $^{\circ}C$
Temperature max
22.0 $\pm$ 2.0 $^{\circ}C$
Comments
sample prepared and stored, and data acquired under standard temperature and pressure conditions.
Type
ambient air
Fluid pressure
1.0 $\pm$ 0.1 $atm$
Comments
MATair_lab_wet
Title
Preparation of the sample for IR measurements

Precursors

Matters

Produced sample

Sample
IOM from Murchison shocked at 5 GPa (this sample)
Processing steps
Step Chronology Date Type Process Changes
#1 before layer formation mechanical Manual selection under optical binocular of about 10 IOM fragments of about 50 microns diameter.
#2 during layer formation mechanical Fragments pressed between two glass slides with a mechanical press Fragments crushed down to a thickness of about 10 microns