Tholins LATMOS Film-IR 95 | SSHADE

Sample

Name: Tholins LATMOS Film-IR 95%N2:5%CH4

Owner of sample

Database

SPAN

Experimentalists

Origin of sample

Date: 2011-01-31
Provider: Nathalie Carrasco at LATMOS

Physical characteristics

Thickness: 550.0 $\pm$ 25.0 $nm$
Surface roughness: 25nm +/- 10nm - might be surestimated
Substrate material: MirrIR
Substrate comments: MirrIR Low emission microscope plates from Kevley Technology
Comments: Homogeneous organic thin film

Sample environment: Temperature

Temperature: 295.0 $\pm$ 2.0 $K$
Comments: Sample kept at ambient temperature

Sample environment: Fluid

Type: ambient air
Fluid temperature: 295.0 $\pm$ 2.0 $K$
Fluid pressure: 1.0 $atm$

Layers in sample

Number

1

Layers

Tholins LATMOS F-IR 95%N2:5%CH4 , 550.0 $nm$